AS ISO 18114-2006 (R2016)
Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
Adopts ISO 18114:2003 to specify a method for determining relative sensitivity factors from ion-implanted reference materials.RECONFIRMATION NOTICETechnical Committee CH-016 has reviewed the content of this publication and inaccordance with Standards Australia procedures for reconfirmation, it has beendetermined that the publication is still valid and does not require change.Certain documents referenced in the publication may have been amended since theoriginal date of publication. Users are advised to ensure that they are using the latestversions of such documents as appropriate, unless advised otherwise in thisReconfirmation Notice.Approved for reconfirmation in accordance with Standards Australia procedures forreconfirmation on 27 June 2016.The following are represented on Technical Committee CH-016:Australian Institute of PhysicsEnvironmental Laboratory Industry GroupNational Association of Testing Authorities AustraliaNational Measurement Institute