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IEEE 1671.5-2008

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IEEE 1671.5-2008 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information

standard by IEEE, 02/01/2012

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Full Description

Scope

The scope of this trial-use standard is the definition of an exchange format, utilizing XML, for exchanging the test adapter information by defining the interface between the UUT and the test station, which includes the description of the test adapter (e.g., physical and electrical characteristics, capabilities/performance, and identification/classification).

Purpose

The purpose of this standard is to provide a standardized format to promote and facilitate interoperability between components of non-manual test systems, by allowing the exchange of test adapter information. The test adapter schema becomes a class of information that can be used within the ATML family of standards.Each instance document contains the definition of a single test adapter model. The test adapter schema provides a structure for describing test adapter capabilities and structure.This standard will allow test adapter information to be transportable across a variety of automatic test equipment (ATE) within the automotive, semiconductor, aerospace, and military industries.

Abstract

New IEEE Standard - Superseded.An exchange format, utilizing XML, for identifying all of the hardware, software, anddocumentation associated with a test station is specified in this document. This test station maybe used as a component of a test program set to test and diagnose a unit under test.

Product Details

Published: 02/01/2012 ISBN(s): 9780738158075, 9780738181660, 9780738181677 Number of Pages: 29File Size: 1 file , 500 KB Product Code(s): STDSU98109, STD98109, STDPD98109