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IEEE 1671.6-2008

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IEEE 1671.6-2008 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information

standard by IEEE, 02/01/2013

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Full Description

Scope

The scope of this standard is the definition of an exchange format, utilizing XML, for exchanging the test station information by defining the description of the test station (e.g., physical and electrical characteristics, components, capabilities/performance, and identification/classification).

Purpose

The purpose of this standard is to provide a standardized format to promote and facilitate interoperabilitybetween components of non-manual test systems, by allowing exchange of test station information. TheTest Station Schema becomes a class of information that can be used within the ATML family of standards.Each instance document contains the definition of a single test station model. The Test Station schemaprovides a structure for describing test station capabilities and structure.This standard will allow common test station information to be transportable across a variety of ATEwithin the automotive, semiconductor, aerospace and military industries.

Abstract

New IEEE Standard - Superseded.An exchange format, utilizing XML, for identifying all of the hardware, software, anddocumentation associated with a test station is specified in this document. This test station maybe used as a component of a test program set to test and diagnose a unit under test.

Product Details

Published: 02/01/2013 ISBN(s): 9780738158099, 9780738181684, 9780738181691 Number of Pages: 0File Size: 1 file , 500 KB Product Code(s): STDSU98110, STD98110, STDPD98110