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standard by ASTM International, 01/10/2000
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1.1 This guide describes the components for a wavelength-dispersive X-ray fluorescence system for materials analysis. This guide can be used as a reference in the apparatus section of test methods for wavelength-dispersive X-ray fluorescence (XRF) analyses of nuclear materials.
1.2 The components recommended include X-ray detectors, signal processing electronics, excitation sources, and dispersing crystals.
1.3 Detailed data analysis procedures are not described or recommended, as they may be unique to a particular analysis problem. Some applications may require the use of complex computer software during data reduction to correct for matrix effects.
1.4 The values stated in SI units are to be regarded as the standard.
1.5 This standard may involve hazardous materials, operations, and equipment. This standard does not purport to address all of the safety problems associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.