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BS PD IEC TS 62607-2-4:2020
M00000994
New product
BS PD IEC TS 62607-2-4:2020 Nanomanufacturing. Key control characteristics
standard by BSI Group, 05/01/2020
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Full Description
This part of IEC 62607 specifies the test method for determining the resistivity and the contactresistance of an individual CNT and the dependability of the measurement.All current amendments available at time of purchase are included with the purchase of this document.